Some electrical properties of the silicon-silicon dioxide system

General Relationship for the Thermal Oxidation of Silicon

1965 • 3,245 citations

Physics and technology of semiconductor devices

1967 • 2,850 citations

An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes

1962 • 1,405 citations

Semiconductor Surfaces

1966 • 801 citations

Characteristics of the Surface-State Charge (Qss) of Thermally Oxidized Silicon

1967 • 697 citations

Surface effects on p-n junctions: Characteristics of surface space-charge regions under non-equilibrium conditions

1966 • 434 citations

Photoemission of Electrons from Silicon into Silicon Dioxide

1965 • 433 citations

The effects of oxide traps on the MOS capacitance

1965 • 430 citations

A Floating Gate and Its Application to Memory Devices

1967 • 414 citations

DENSITY OF SiO2–Si INTERFACE STATES

1966 • 404 citations

MOS CONDUCTANCE TECHNIQUE FOR MEASURING SURFACE STATE PARAMETERS

1965 • 357 citations

Redistribution of Acceptor and Donor Impurities during Thermal Oxidation of Silicon

1964 • 330 citations

Properties of gold in silicon

1966 • 311 citations

Stabilization of Silicon Surfaces by Thermally Grown Oxides*

1959 • 240 citations

Barrier energies in metal-silicon dioxide-silicon structures

1966 • 238 citations

Photocurrent, Space-Charge Buildup, and Field Emission in Alkali Halide Crystals

1953 • 224 citations

Metal-silicon Schottky barriers

1968 • 153 citations

Photoemission of Electrons from Silicon and Gold into Silicon Dioxide

1966 • 147 citations

SURFACE STATES IN SILICON FROM CHARGES IN THE OXIDE COATING

1968 • 141 citations

Sodium distribution in thermal oxide on silicon by radiochemical and MOS analysis

1966 • 126 citations

Polarization Phenomena and Other Properties of Phosphosilicate Glass Films on Silicon

1966 • 124 citations

Stabilization of SiO₂ Passivation Layers with P₂O₅

1964 • 120 citations

Observation of Impurity Redistribution During Thermal Oxidation of Silicon Using the MOS Structure

1965 • 120 citations

Investigation of Silicon-Silicon Dioxide Interface Using MOS Structure

1966 • 101 citations

Impurity Redistribution and Junction Formation in Silicon by Thermal Oxidation

1960 • 78 citations

Photoemission of Electrons from Metals into Silicon Dioxide

1966 • 77 citations

The defect structure of grown silicon dioxide films

1965 • 59 citations

CHARGE STORAGE MODEL FOR VARIABLE THRESHOLD FET MEMORY ELEMENT

1969 • 57 citations

Diffusion of gallium through a silicon dioxide layer

1964 • 49 citations

Al2O3-SILICON INSULATED GATE FIELD EFFECT TRANSISTORS

1968 • 49 citations

Properties of Gold Doped MOS Structures

1967 • 46 citations

Photoemission of Electrons from Silicon into Silicon Dioxide. Effects of Ion Migration in the Oxide

1966 • 45 citations

Interface states and interface disorder in the Si-SiO2 system

1967 • 42 citations

MEMORY BEHAVIOR OF AN MNS CAPACITOR

1968 • 40 citations

The influence of oxidation rate and heat treatment on the Si surface potential in the Si-SiO<inf>2</inf>system

1966 • 34 citations

The effect of ambient, temperature and cooling rate, on the surface charge at the silicon/ silicon dioxide interface†

1968 • 24 citations

Effects of ionizing radiation on MOS devices

1969 • 23 citations

Effect of diffused oxygen and gold on surface properties of oxidized silicon

1967 • 23 citations

Effect of gold on surface properties and leakage current of MOS transistors

1967 • 18 citations

Stability and surface charge in the MOS system†

1968 • 16 citations

Further Observations on the Oxidation of Zirconium in Dry Oxygen

1967 • 5 citations

The application of silicon nitride in the MIS system†

1968 • 2 citations