Investigation of Silicon-Silicon Dioxide Interface Using MOS Structure

An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes

1962 • 1,405 citations

Ion Transport Phenomena in Insulating Films

1965 • 516 citations

Stabilization of SiO₂ Passivation Layers with P₂O₅

1964 • 120 citations

Electrochemical Phenomena in Thin Films of Silicon Dioxide on Silicon

1964 • 35 citations

Effect of Temperature and Bias on Glass-Silicon Interfaces

1964 • 25 citations