Metal-silicon Schottky barriers

DOI: 10.1016/0026-2714(68)90062-0

Microelectronics Reliability

Data up to Jan 2025

Published1968

Citations153

References1

Fields

Materials science Physics Optoelectronics Nuclear magnetic resonance Composite material

Total Citations Per Year

Abstract

References (1)

Rectifying Semiconductor Contacts

1956 • 290 citations

Cited By (0)

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