Very-Low Voltage (VLV) and VLV Ratio (VLVR) Testing for Quality, Reliability, and Outlier Detection

Defect classes-an overdue paradigm for CMOS IC testing

2002 • 207 citations

Very-low-voltage testing for weak CMOS logic ICs

2002 • 175 citations

Current ratios: a self-scaling technique for production I/sub DDQ/ testing

2003 • 159 citations

Detecting delay flaws by very-low-voltage testing

2002 • 97 citations

Statistical post-processing at wafersort-an alternative to burn-in and a manufacturable solution to test limit setting for sub-micron technologies

2003 • 93 citations

Nanometer technology effects on fault models for IC testing

1999 • 79 citations

Quantitative analysis of very-low-voltage testing

2002 • 66 citations

Impact of STI-induced stress, inverse narrow width effect, and statistical V/sub TH/ variations on leakage currents in 120 nm CMOS

2004 • 50 citations

Obtaining high defect coverage for frequency-dependent defects in complex ASICs

2003 • 44 citations

IDDQ defect detection in deep submicron CMOS ICs

2002 • 31 citations

A study of stress-induced p/sup +//n salicided junction leakage failure and optimized process conditions for sub-0.15-μm CMOS technology

2002 • 19 citations

Untitled

2003 • 8 citations