Nanometer technology effects on fault models for IC testing

Fault Modeling and Logic Simulation of CMOS and MOS Integrated Circuits

1978 • 626 citations

Inductive Fault Analysis of MOS Integrated Circuits

1985 • 509 citations

Bridging and Stuck-At Faults

1974 • 242 citations

Test Routines Based on Symbolic Logical Statements

1959 • 177 citations

Iddq test: sensitivity analysis of scaling

2002 • 153 citations

An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing

2002 • 143 citations

Finding defects with fault models

2002 • 63 citations

Introduction to IDDQ Testing

1997 • 63 citations

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment

2003 • 52 citations

Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment

2002 • 37 citations

Testing in nanometer technologies

1999 • 2 citations

Testing in nanometer technologies

2003 • 1 citations