Obtaining high defect coverage for frequency-dependent defects in complex ASICs

Too much delay fault coverage is a bad thing

2002 • 261 citations

Broad-side delay test

1994 • 258 citations

Test method evaluation experiments and data

2002 • 148 citations

Scan-based transition fault testing - implementation and low cost test challenges

2003 • 129 citations

Current signatures [VLSI circuit testing]

2002 • 121 citations

Neighbor selection for variance reduction in I/sub DDQ/ and other parametric data

2002 • 111 citations

Detecting delay flaws by very-low-voltage testing

2002 • 97 citations

Statistical post-processing at wafersort-an alternative to burn-in and a manufacturable solution to test limit setting for sub-micron technologies

2003 • 93 citations

Variance reduction using wafer patterns in I/sub ddQ/ data

2002 • 75 citations

Screening minVDD outliers using feed-forward voltage testing

2003 • 68 citations

Delta Iddq for testing reliability

2002 • 50 citations

Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?

2002 • 48 citations