An analytical model of SEM and STEM charge collection images of dislocations in thin semiconductor layers: I. Minority carrier generation, diffusion, and collection

Handbook of Mathematical Functions

1966 • 42,275 citations

Table of Integrals, Series, and Products

1980 • 19,996 citations

Table of Integrals, Series and Products.

1981 • 8,884 citations

Handbook of Mathematical Functions.

1966 • 8,183 citations

Methods of theoretical physics

1954 • 4,781 citations

Determination of Kilovolt Electron Energy Dissipation vs Penetration Distance in Solid Materials

1971 • 786 citations

Scanning electron microscopy - 1979

1979 • 694 citations

Quantitative Scanning Electron Microscopy

1976 • 285 citations

Theory of life time measurements with the scanning electron microscope: Steady state

1976 • 220 citations

Energy dissipation in a thin polymer film by electron beam scattering

1974 • 145 citations

Electron-Beam Excited Minority-Carrier Diffusion Profiles in Semiconductors

1972 • 119 citations

Scanning Electron Microscopy

1975 • 91 citations

Spatial Distribution of the Fluorescent Radiation Emission Caused by an Electron Beam

1970 • 75 citations

Experimental and theoretical study of energy dissipation profiles of keV electrons in polymethylmethacrylate

1975 • 59 citations

Investigation of kilovolt electron energy dissipation in solids

1974 • 52 citations

The electrical recombination efficiency of individual edge dislocations and stacking fault defects in n-type silicon

1979 • 52 citations

Analysis of the interaction of an electron beam with a solar cell—I

1978 • 49 citations

Scattering of Highly Focused Kilovolt Electron Beams by Solids

1969 • 48 citations

Combined scanning (EBIC) and transmission electron microscopic investigations of dislocations in semiconductors

1979 • 43 citations

Computer simulation of SEM electron beam induced current images of dislocations and stacking faults

1980 • 41 citations

Electrically active stacking faults in CMOS integrated circuits

1979 • 36 citations

Observation of dislocations and microplasma sites in semiconductors by direct correlations of STEBIC, STEM and ELS

1980 • 26 citations

The Microscopy Of Semiconducting Materials

1980 • 22 citations

Carrier profiles and collection efficiency in Gaussian p-n junctions under electron beam bombardment

1970 • 18 citations

SEM observation and contrast mechanism of stacking faults in an epitaxial silicon layer

1974 • 16 citations