SEM observation and contrast mechanism of stacking faults in an epitaxial silicon layer

Dislocations and Plastic Flow in Crystals

1954 • 2,582 citations

Penetration and energy-loss theory of electrons in solid targets

1972 • 1,332 citations

Determination of Kilovolt Electron Energy Dissipation vs Penetration Distance in Solid Materials

1971 • 786 citations

Defect Electronics in Semiconductors

1972 • 297 citations

Oxidation-induced stacking faults in silicon. II. Electrical effects in P N diodes

1974 • 87 citations

Electrically Active Stacking Faults in Silicon

1973 • 87 citations

Observations of Individual Dislocations and Oxygen Precipitates in Silicon with a Scanning Electron Beam Method

1965 • 70 citations

Investigation of kilovolt electron energy dissipation in solids

1974 • 52 citations

Microplasma breakdown at stair-rod dislocations in silicon

1963 • 45 citations

Investigation of Electron Penetration and X‐Ray Production in Solid Targets

1973 • 40 citations

The direct observation of electrical leakage paths due to crystal defects by use of the scanning electron microscope

1966 • 23 citations

Silicon power device material problems

1967 • 22 citations

Device failure analysis by scanning electron microscopy

1969 • 7 citations