Generalized Ellipsometric Method for the Absorbing Substrate Covered with a Transparent-Film System Optical Constants of Silicon at 3655 Å*

Interspecimen Comparison of the Refractive Index of Fused Silica*,†

1965 • 3,646 citations

Optical Constants of Silicon in the Region 1 to 10 ev

1960 • 556 citations

Electronic Spectra of Crystalline Germanium and Silicon

1964 • 448 citations

Band Structure of Silicon from an Adjusted Heine-Abarenkov Calculation

1966 • 241 citations

Interband Transitions in Groups 4, 3-5, and 2-6 Semiconductors

1962 • 202 citations

Definitions and conventions in ellipsometry

1969 • 173 citations

Surface measurements on freshly cleaved silicon p-n junctions

1960 • 101 citations

Optical investigation of the band structure of Ge-Si alloys

1961 • 98 citations

Optical Constants of Incandescent Refractory Metals

1966 • 69 citations

Optical absorption in germanium

1960 • 61 citations

Ellipsometric Method for the Determination of All the Optical Parameters of the System of an Isotropic Nonabsorbing Film on an Isotropic Absorbing Substrate Optical Constants of Silicon*

1969 • 52 citations

Ellipsometric Technique for Obtaining Substrate Optical Constants

1970 • 46 citations

Ellipsometric liquid immersion method for the determination of all the optical parameters of the system: Nonabsorbing film on an absorbing substrate

1969 • 38 citations

Error analysis of angle of incidence measurements

1969 • 33 citations

Multiple-Angle-of-Incidence Ellipsometry of Very Thin Films*

1971 • 29 citations

Optical constants of germanium and gray tin the . method

1967 • 26 citations