Surface charge and stress in the Si/SiO2 system

American Institute of Physics Handbook

1964 • 2,897 citations

Analysis of Bi-Metal Thermostats

1925 • 2,226 citations

Characteristics of the Surface-State Charge (Qss) of Thermally Oxidized Silicon

1967 • 697 citations

Measurement of Strains at Si-SiO2 Interface

1966 • 394 citations

SURFACE STATES IN SILICON FROM CHARGES IN THE OXIDE COATING

1968 • 141 citations

High-Temperature Annealing of Oxidized Silicon Surfaces

1971 • 106 citations

RESIDUAL STRESSES AT AN OXIDE-SILICON INTERFACE

1967 • 53 citations

A study of non-stoichiometry in gallium arsenide by precision lattice parameter measurements

1971 • 40 citations

Fully Automated High-Precision X-Ray Diffraction

1968 • 37 citations

Stress at the Si—SiO₂interface and its relationship to interface states

1968 • 34 citations

Symmetry of Interface Charge Distribution in Thermally Oxidized Silicon

1967 • 25 citations

The effect of ambient, temperature and cooling rate, on the surface charge at the silicon/ silicon dioxide interface†

1968 • 24 citations

Surface charges induced by mechanical stresses in the silicon-silicon oxide interface

1971 • 13 citations

Surface charge and annealing in the Si/SiO₂system †

1971 • 6 citations