Atomic and molecular ejection from ion-bombarded reacted single-crystal surfaces. Oxygen on copper(100)

Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

1973 • 440 citations

Sputtering of chemisorbed gas (nitrogen on tungsten) by low-energy ions

1974 • 317 citations

Work-Function Dependence of Negative-Ion Production during Sputtering

1978 • 200 citations

Low energy ion impact phenomena on single crystal surfaces

1978 • 184 citations

Formation of small metal clusters by ion bombardment of single crystal surfaces

1978 • 135 citations

Computer Simulation of Sputtering

1968 • 127 citations

Computer simulation of the sputtering of clusters

1976 • 124 citations

Structure sensitive factors in molecular cluster formation by ion bombardment of single crystal surfaces

1978 • 116 citations

Angular Distributions of Ejected Particles from Ion-Bombarded Clean and Reacted Single-Crystal Surfaces

1978 • 80 citations

Computer simulation of sputtering II

1973 • 76 citations

INTERNATIONAL TABLES OF SELECTED CONSTANTS

1981 • 76 citations

Study of the sputtering of adsorbates by low energy ions (O on Ni)

1977 • 54 citations

Depth profile detection limit of 3×1015 atom cm−3 for As in Si using Cs+ bombardment negative secondary ion mass spectrometry

1977 • 46 citations

Adsorption and surface reactivity of metals by secondary ion mass spectrometry. Part 1.—Adsorption of carbon monoxide on nickel and copper

1976 • 41 citations

Oxygen adsorption on molybdenum studied by low-energy secondary-ion mass spectrometry and electron-induced desorption

1977 • 39 citations

The SIMS spectrum of the O-W(100) chemisorption system

1978 • 25 citations