Work-Function Dependence of Negative-Ion Production during Sputtering

Theory of Auger Ejection of Electrons from Metals by Ions

1954 • 1,336 citations

Electron-Stimulated Desorption as a Tool for Studies of Chemisorption: A Review

1971 • 427 citations

Progress in analytic methods for the ion microprobe mass analyzer

1969 • 193 citations

The use of secondary ion mass spectrometry in surface analysis

1975 • 112 citations

On the excited state of sputtered particles

1965 • 96 citations

Mechanism for negative-ion production in the surface-plasma negative-hydrogen-ion source

1976 • 77 citations

Contact-potential measurements of the adsorption of Cs, O2 and H2 on (110) Ta

1967 • 56 citations

Depth profile detection limit of 3×1015 atom cm−3 for As in Si using Cs+ bombardment negative secondary ion mass spectrometry

1977 • 46 citations