Leakage studies in high-density dynamic MOS memory devices

On the determination of minority carrier lifetime from the transient response of an MOS capacitor

1967 • 222 citations

Interpretation of surface and bulk effects using the pulsed MIS capacitor

1971 • 159 citations

Basic equations for statistics, recombination processes, and photoconductivity in amorphous insulators and semiconductors

1972 • 123 citations

On the separation of bulk and surface components of lifetime using the pulsed MOS capacitor

1970 • 111 citations

The gate-controlled diode s0 measurement and steady-state lateral current flow in deeply depleted MOS structures

1974 • 49 citations

Thermal carrier generation in charge-coupled devices

1975 • 30 citations

Defect-controlled generation in deeply depleted MOS-C structures

1975 • 20 citations

Characterization of reverse-bias leakage currents and their effect on the holding time characteristics of MOS dynamic RAM circuits

1977 • 15 citations

The charge-coupled RAM cell concept

1976 • 15 citations