Stabilization of MOS devices

Ion Transport Phenomena in Insulating Films

1965 • 516 citations

Surface effects on p-n junctions: Characteristics of surface space-charge regions under non-equilibrium conditions

1966 • 434 citations

The effects of oxide traps on the MOS capacitance

1965 • 430 citations

DENSITY OF SiO2–Si INTERFACE STATES

1966 • 404 citations

An investigation of instability and charge motion in metal-silicon oxide-silicon structures

1966 • 132 citations

Sodium distribution in thermal oxide on silicon by radiochemical and MOS analysis

1966 • 126 citations

Polarization Phenomena and Other Properties of Phosphosilicate Glass Films on Silicon

1966 • 124 citations

Stabilization of SiO₂ Passivation Layers with P₂O₅

1964 • 120 citations

Investigation of Silicon-Silicon Dioxide Interface Using MOS Structure

1966 • 101 citations

Field effect studies of the oxidized silicon surface

1966 • 28 citations

Thermal Oxidation of Silicon: Growth Mechanism and Interface Properties

1967 • 22 citations

Hydrogen-induced surface space-charge regions in oxide-protected silicon

1965 • 14 citations

Thermal Oxidation of Silicon

1988 • 8 citations

Sodium distribution in oxide by radiochemical analysis and its effect on silicon surface potential

1965 • 2 citations