Back to search
The complete base profile shape in a pushed-out diffused transistor analyzed by radiotracer methods
Data up to Jan 2025
Published1974
Citations14
References6
Total Citations Per Year
Abstract
References (6)
Resistivity of Bulk Silicon and of Diffused Layers in Silicon
1962 • 688 citations
Atomic Diffusion in Semiconductors
1973 • 637 citations
Interactions in Sequential Diffusion Processes in Semiconductors
1968 • 133 citations
Discovery of anomalous base regions in transistors
1972 • 32 citations
Alternative relationship for converting incremental sheet resistivity measurements into profiles of impurity concentration
1967 • 17 citations
Anomalous diffusion effects in silicon (a review)
1968 • 15 citations
Cited By (0)
Loading...