Carrier-density fluctuations and the IGFET mobility near threshold

Properties of Semiconductor Surface Inversion Layers in the Electric Quantum Limit

1967 • 1,889 citations

The Si-SiO₂Interface - Electrical Properties as Determined by the Metal-Insulator-Silicon Conductance Technique

1967 • 1,765 citations

Self-Consistent Results for<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>n</mml:mi></mml:math>-Type Si Inversion Layers

1972 • 1,162 citations

Description of the SiO2Si interface properties by means of very low frequency MOS capacitance measurements

1971 • 498 citations

Transport Properties of Electrons in Inverted Silicon Surfaces

1968 • 327 citations

The scattering of electrons by surface oxide charges and by lattice vibrations at the silicon-silicon dioxide interface

1972 • 264 citations

Mobility Anisotropy and Piezoresistance in Silicon p-Type Inversion Layers

1968 • 199 citations

On the role of scattering by surface roughness in silicon inversion layers

1973 • 160 citations

Mott-Anderson Localization in the Two-Dimensional Band Tail of Si Inversion Layers

1974 • 99 citations

Disorder-induced carrier localization in silicon surface inversion layers

1974 • 93 citations

Surface Potential Fluctuations Generated by Interface Charge Inhomogeneities in MOS Devices

1972 • 93 citations

Far-Infrared Cyclotron Resonance in the Inversion Layer of Silicon

1974 • 90 citations

Theory of the carrier-density fluctuations in an IGFET near threshold

1975 • 78 citations

Variable-range hopping in a silicon inversion layer

1974 • 72 citations

Substrate Bias Effects on Electron Mobility in Silicon Inversion Layers at Low Temperatures

1975 • 71 citations

Carrier mobilities at weakly inverted silicon surfaces

1974 • 70 citations

Subthreshold characteristics of insulated-gate field-effect transistors

1973 • 68 citations

Effect of Coulomb scattering on silicon surface mobility

1974 • 49 citations

Evidence for a mobility edge in inversion layers

1974 • 43 citations

Surface mobility measurement using acoustic surface waves

1973 • 36 citations

Two-dimensional electron-lattice scattering in thermally oxidized silicon surface-inversion layers

1974 • 36 citations

Relative importance of phonon scattering to carrier mobility in Si surface layer at room temperature

1973 • 30 citations

Effect of charge inhomogeneities on silicon surface mobility

1973 • 30 citations

Scattering mechanisms in inversion channels of MIS structures on silicon

1972 • 30 citations

Interface Imaging by Scanning Internal Photoemission

1974 • 25 citations

Ionised impurity scattering in silicon surface channels

1970 • 22 citations

Discussion of the surface-potential fluctuations caused by oxide-charge fluctuations

1974 • 21 citations

Semiconductor Surface Electrostatics

1971 • 17 citations

Peaked structure appearing in the field effect mobility of silicon MOS devices at temperatures above 20K

1974 • 15 citations

Temperature dependence of apparent threshold voltage of silicon MOS transistors at cryogenic temperatures

1968 • 14 citations