Diffraction from stepped surfaces

Markov Random Fields and Their Applications

1980 • 1,309 citations

Finite Markov Processes and Their Applications.

1981 • 597 citations

Damped oscillations in reflection high energy electron diffraction during GaAs MBE

1983 • 362 citations

Oscillations in the surface structure of Sn-doped GaAs during growth by MBE

1981 • 360 citations

Morphology of Epitaxial Growth of GaAs by a Molecular Beam Method: The Observation of Surface Structures

1970 • 313 citations

Electron spectroscopy for surface analysis

1978 • 237 citations

LEED studies of surface imperfections

1982 • 232 citations

Low-energy electron diffraction from imperfect structures

1970 • 187 citations

Electrolytic decomposition and photodecomposition of compound semiconductors in contact with electrolytes

1978 • 175 citations

Surface Processes in the Growth of Silicon on (111) Silicon in Ultrahigh Vacuum

1968 • 169 citations

Diffraction from surfaces with randomly distributed steps

1982 • 167 citations

Epitaxy of Si(111) as studied with a new high resolving LEED system

1982 • 162 citations

Quantitative evaluation of random distributed steps at interfaces and surfaces

1978 • 142 citations

Measurement of surface defects by low-energy electron diffraction

1984 • 129 citations

Coherence length and/or transfer width?

1979 • 127 citations

The LEED Instrument Response Function

1971 • 126 citations

RED intensity oscillations during MBE of GaAs

1981 • 111 citations

Diffuse LEED intensities of disordered crystal surfaces

1978 • 110 citations

LEED from statistical step models

1971 • 104 citations

A statistical model for the scattering of atoms from randomly stepped surfaces

1981 • 102 citations

Thermodynamic aspects of molecular beam epitaxy: High temperature growth in the GaAs/Ga1−xAlxAs system

1985 • 89 citations

The dependence of RHEED oscillations on MBE growth parameters

1985 • 85 citations

The resolving power of a low-energy electron diffractometer and the analysis of surface defects

1980 • 83 citations

Quantitative island size determination in the chemisorbed layer W(110) p(2 × 1)-O

1979 • 76 citations

On the phase transition between the (7 × 7) and (1 × 1) structures of silicon (111) surface studied by reflection electron microscopy

1983 • 76 citations

Diffuse LEED intensities of disordered crystal surfaces

1978 • 75 citations

Disorder on GaAs(001) surfaces prepared by molecular beam epitaxy

1983 • 70 citations

Finite Markov Processes and Their Applications.

1981 • 70 citations

Comments on “RED intensity oscillations during MBE of GaAs”

1981 • 69 citations

Rheed evidence for a domain structure of GaAs(001)−2 × 4 AND −4 × 2 reconstructed surfaces

1982 • 66 citations

Diffuse LEED intensities of disordered crystal surfaces

1978 • 65 citations

Comparative LEED and RHEED examination of stepped surfaces; Application to Cu(111) and GaAs(100) vicinal surfaces

1977 • 58 citations

Atomic correlations of stepped surfaces and interfaces

1984 • 51 citations

RHEED streaks and instrument response

1983 • 51 citations

Exact one-dimensional pair correlation functions of a monolayer/substrate system

1985 • 49 citations

Extrinsic effects in reflection high-energy electron diffraction patterns from MBE GaAs

1984 • 42 citations

Oxygen on cleaved silicon (111): Effects of atomic steps and residual gases

1980 • 41 citations

Electron diffraction from a statistically rough surface

1973 • 39 citations

Atomic correlations during the first stages of epitaxy

1984 • 39 citations

Misoriented surfaces with randomly distributed steps

1984 • 39 citations

Diffuse LEED intensities of disordered crystal surfaces

1978 • 37 citations

Sensitive reflection high-energy electron diffraction measurement of the local misorientation of vicinal GaAs surfaces

1984 • 36 citations

Untersuchung der kondensation und verdampfung von alkalihalogenid-kristallen mit molekularstrahlmethoden

1972 • 35 citations

Temporal intensity variations in RHEED patterns during film growth of GaAs by MBE

1983 • 31 citations

Finite size effects on reconstruction domains of tungsten(001) surfaces

1984 • 26 citations

High resolution measurement of the step distribution at the Si/SiO2 interface

1984 • 22 citations

A method for the calculation of LEED angular profiles to estimate overlayer spacings and island size distributions

1984 • 21 citations

Two-dimensional overlayer growth: Island size and island separation distributions

1985 • 15 citations

On the Discrete Spectral Densities of Markov Pulse Trains

1964 • 8 citations

Atomic steps on Ge(100) surfaces studied by RHEED

1980 • 6 citations