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Threshold voltage variations in N-channel mos transistors and MOSFET-based sensors due to optical radiation
Data up to Jan 2025
Published1986
Citations17
References7
Total Citations Per Year
Abstract
References (7)
Semiconductor Surfaces
1966 • 801 citations
Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structures
1965 • 416 citations
Influence of illumination on MIS capacitances in the strong inversion region
1967 • 73 citations
Theory of the small-signal photovoltage at semiconductor surfaces
1967 • 62 citations
Quantitative analysis of the effects of steady-state illumination on the MOS-capacitor—I
1970 • 42 citations
Conditions for quasi-equilibrium in a semiconductor surface space-charge layer
1965 • 26 citations
Quantitative analysis of the effects of steady-state illumination on the MOS-capacitor—II
1970 • 18 citations
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