Atomic-force microscopy on the Si(111)7×7 surface

Atomic Force Microscope

1986 • 14,074 citations

Positioning single atoms with a scanning tunnelling microscope

1990 • 3,051 citations

Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity

1991 • 2,312 citations

Kelvin probe force microscopy

1991 • 2,196 citations

7 × 7 Reconstruction on Si(111) Resolved in Real Space

1983 • 1,838 citations

Atomic-scale friction of a tungsten tip on a graphite surface

1987 • 1,715 citations

True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive Forces

1993 • 656 citations

Highly oriented thin films of poly(tetrafluoroethylene) as a substrate for oriented growth of materials

1991 • 588 citations

Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope

1990 • 580 citations

Friction measurements on phase-separated thin films with a modified atomic force microscope

1992 • 520 citations

Interatomic Forces in Scanning Tunneling Microscopy: Giant Corrugations of the Graphite Surface

1986 • 444 citations

Contamination-mediated deformation of graphite by the scanning tunneling microscope

1986 • 341 citations

Friction and molecular structure: the behaviour of some thermoplastics

1972 • 331 citations

Friction and wear of Langmuir-Blodgett films observed by friction force microscopy

1992 • 273 citations

Force microscopy with a bidirectional capacitance sensor

1990 • 192 citations

Multifunctional probe microscope for facile operation in ultrahigh vacuum

1993 • 171 citations

Effect of tip profile on atomic-force microscope images: A model study

1988 • 128 citations

Theoretical interpretation of atomic-force-microscope images of graphite

1989 • 119 citations

Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum

1992 • 89 citations

Scanning tunneling microscope tip–sample interactions: Atomic modification of Si and nanometer Si Schottky diodes

1993 • 72 citations

Ultrahigh-vacuum scanning force microscopy: Atomic-scale resolution at monatomic cleavage steps

1994 • 58 citations

Scanning probe microscopy on the surface of Si(111)

1994 • 20 citations

Observation of Hydrogen-Terminated Silicon (111) Surface by Ultrahigh-Vacuum Atomic Force Microscopy

1993 • 18 citations

Study and control of molecule–surface interaction at the atomic level: Sb4 on Si(001)

1994 • 7 citations