Back to search

F2 adsorption on Si observed with SIMS and QCM

J. W. Coburn, E.‐A. Knabbe, E. Kay
DOI: 10.1116/1.571340
Journal of Vacuum Science and Technology

Data up to Jan 2025

Published1982
Citations15
References0
Fields
ChemistryPhysicsAtomic physicsPhysical chemistryCrystallography

Total Citations Per Year

Abstract

References (0)

No references found

Cited By (0)

Loading...
F2 adsorption on Si observed with SIMS and QCM (1982) – Journal of Vacuum Science and Technology | Metascience Observatory Explorer