Influence of the Generation Distribution on the Calculated EBIC Contrast of Line Defects

Handbook of Mathematical Functions

1966 • 42,275 citations

Table of Integrals, Series, and Products

1980 • 19,996 citations

Methods of Theoretical Physics

1954 • 13,575 citations

Table of Integrals, Series and Products.

1981 • 8,884 citations

Methods of theoretical physics

1954 • 4,781 citations

Classical electricity and magnetism

1961 • 1,586 citations

Determination of Kilovolt Electron Energy Dissipation vs Penetration Distance in Solid Materials

1971 • 786 citations

Classical Electricity and Magnetism

1961 • 297 citations

Quantitative Scanning Electron Microscopy

1976 • 285 citations

Scanning Electron Microscopy/1973

1974 • 227 citations

Scanning Electron Microscopy 1976

1977 • 149 citations

An analytical model of SEM and STEM charge collection images of dislocations in thin semiconductor layers: I. Minority carrier generation, diffusion, and collection

1981 • 119 citations

Electron penetration and energy transfer in solid targets

1977 • 108 citations

Scanning Electron Microscopy

1972 • 107 citations

Spatial Distribution of the Fluorescent Radiation Emission Caused by an Electron Beam

1970 • 75 citations

Experimental and theoretical study of energy dissipation profiles of keV electrons in polymethylmethacrylate

1975 • 59 citations

On the sensitivity of the EBIC technique as applied to defect investigations in silicon

1981 • 49 citations

A contribution to the theory of the ebic contrast of lattice defects in semiconductors

1981 • 45 citations

Computer simulation of SEM electron beam induced current images of dislocations and stacking faults

1980 • 41 citations

A contribution to the theory of the EBIC contrast of lattice defects in semiconductors

1981 • 25 citations

The Microscopy Of Semiconducting Materials

1980 • 22 citations

Scanning Electron Microscopic Observation of Oxidation-Induced Stacking Faults in Silicon

1980 • 14 citations

On the EBIC Contrast of Dislocations in Si

1982 • 10 citations

On the characterization of electrically active inhomogeneities in semiconductor silicon by charge collection at schottky barriers using the SEM‐EBIC (II). Contrast due to defects

1980 • 10 citations

On the analysis of EBIC contrast of crystal defects

1980 • 3 citations