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Detector Background and Sensitivity of Semiconductor X-Ray Fluorescence Spectrometers

F.S. Goulding, J.M. Jaklevic, B.V. Jarrett, D.A. Landis
DOI: 10.1007/978-1-4613-9966-7_36
Advances in X-ray Analysis

Data up to Jan 2025

Published1972
Citations22
References3
Fields
Materials sciencePhysicsEngineeringOpticsOptoelectronicsElectronic engineering

Total Citations Per Year

Abstract

References (3)

Semiconductor Radiation Detectors

1970 • 55 citations

Geometric Control of Surface Leakage Current and Noise in Lithium Drifted Silicon Radiation Detectors

1966 • 30 citations

TRACE ELEMENT ANALYSIS BY X-RAY FLUORESCENCE

1971 • 26 citations

Cited By (0)

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