Comparison of the noise of different electron detection systems using a scintillator‐photomultiplier combination

Wide-band detector for micro-microampere low-energy electron currents

1960 • 366 citations

Scanning electron microscopy/1976/II.

1976 • 300 citations

Scanning Electron Microscopy

1974 • 180 citations

Scanning Electron Microscopy/1976/I

1977 • 172 citations

Measuring the backscattering coefficient and secondary electron yield inside a scanning electron microscope

1980 • 148 citations

Factors Affecting Contrast and Resolution in the Scanning Electron Microscope†

1959 • 124 citations

A Theory of Noise for Electron Multipliers

1938 • 122 citations

Detector system for backscattered electrons by conversion to secondary electrons

1979 • 56 citations

Scanning Electron Microscopy

1968 • 44 citations

Shot Effect of Secondary Electrons from Nickel and Beryllium

1937 • 39 citations

Afterpulses in liquid scintillation counters

1973 • 11 citations

Preparation of P‐47 scintillators for STEM

1981 • 10 citations