Ellipsometry and Polarized Light

DOI: 10.1016/0376-4583(78)90059-6

Surface Technology

Data up to Jan 2025

Published1978

Citations1,149

References2

Fields

Materials science Physics Optoelectronics Optics Nanotechnology

Total Citations Per Year

Abstract

References (2)

Ueber Oberflächenschichten. I. Theil

1889 • 160 citations

Application of ellipsometry to surface films and film growth

1977 • 15 citations

Cited By (0)

No citing papers found in database

Ellipsometry and Polarized Light (1978) – Surface Technology | Metascience Observatory Explorer