Tunneling in MIS structures—I

The theory of impurity conduction

1961 • 1,431 citations

An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes

1962 • 1,405 citations

Semiconductor Surfaces

1966 • 801 citations

Thomas-Fermi Approach to Impure Semiconductor Band Structure

1963 • 632 citations

Tunneling from an Independent-Particle Point of View

1961 • 620 citations

MOS CONDUCTANCE TECHNIQUE FOR MEASURING SURFACE STATE PARAMETERS

1965 • 357 citations

Determination of the Properties of Films on Silicon by the Method of Ellipsometry

1962 • 253 citations

The silicon insulated-gate field-effect transistor

1963 • 248 citations

Space Charge Calculations for Semiconductors

1958 • 207 citations

Review of Germanium Surface Phenomena

1956 • 175 citations

New Type of Negative Resistance in Barrier Tunneling

1966 • 169 citations

Photoemission of Electrons from Silicon and Gold into Silicon Dioxide

1966 • 147 citations

Physical limitations on the frequency response of a semiconductor surface inversion layer

1965 • 144 citations

Lateral AC current flow model for metal-insulator-semiconductor capacitors

1965 • 135 citations

Limitations of the MOS capacitance method for the determination of semiconductor surface properties

1965 • 130 citations

Impedance of semiconductor-insulator-metal capacitors

1964 • 129 citations

Field Effect‐Capacitance Analysis of Surface States on Silicon

1963 • 115 citations

Electron Mobility Studies in Surface Space-Charge Layers in Vapor-Deposited CdS Films

1965 • 114 citations

Effect of Degenerate Semiconductor Band Structure on Current-Voltage Characteristics of Silicon Tunnel Diodes

1963 • 73 citations

Tunneling from Metal to Semiconductors

1965 • 71 citations

Experimental Determination of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>E</mml:mi><mml:mo>−</mml:mo><mml:mi>k</mml:mi></mml:math>Relationship in Electron Tunneling

1966 • 69 citations

Impurity Conduction in Silicon

1961 • 55 citations

Experimental Energy-Momentum Relationship Determination Using Schottky Barriers

1966 • 50 citations

MOS STUDY OF INTERFACE-STATE TIME CONSTANT DISPERSION

1967 • 34 citations

Automatic Plotting of Conductance and Capacitance of Metal-Insulator-Semiconductor Diodes or Any Two Terminal Complex Admittance

1966 • 32 citations

Frequency response of the surface inversion layer in silicon

1964 • 25 citations

Four-terminal field-effect transistors

1965 • 16 citations

Surface photovoltage measurements in vapour-deposited CdS

1966 • 10 citations

Tunneling in the metal-insulator-semiconductor structure&amp;amp;#8212;I. Silicon-silicon dioxide, II. Thin film Al Al&lt;inf&gt;2&lt;/inf&gt;O&lt;inf&gt;3&lt;/inf&gt;-CdS and Al-Al&lt;inf&gt;2&lt;/inf&gt;O&lt;inf&gt;3&lt;/inf&gt;-CdSe

1966 • 2 citations

Use of transient measurements in metal-insulator-semiconductor structures to determine semiconductor doping densities

1965 • 1 citations