A unified explanation for secondary ion yields

Binding energies in atomic negative ions

1975 • 1,526 citations

Physics of Atomic Collisions

1965 • 542 citations

Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectra

1973 • 432 citations

Inelastic ion-surface collisions

2009 • 360 citations

Evaluation of a cesium positive ion source for secondary ion mass spectrometry

1977 • 340 citations

Ion Microprobe Mass Analyzer

1972 • 238 citations

Optical and Infrared Detectors

1977 • 225 citations

Secondary−ion mass spectrometry and its use in depth profiling

1975 • 99 citations

Evaluation of the local thermal equilibrium model for quantitative secondary ion mass spectrometric analysis

1976 • 80 citations

The mechanism of simultaneous implantation and sputtering by high energy oxygen ions during secondary ion mass spectrometry (SIMS) analysis

1974 • 62 citations