On the suitability of the available cooling holders for low-dose work with the Philips EM400

Frank P. Booy, E.F.J. Van Bruggen

DOI: 10.1016/0304-3991(84)90213-4

Ultramicroscopy

Data up to Jan 2025

Published1984

Citations11

References2

Fields

Materials science Chemistry Computer science Physics Engineering Optics Engineering physics Artificial intelligence

Total Citations Per Year

Abstract

References (2)

Measurement and compensation of defocusing and aberrations by Fourier processing of electron micrographs

1971 • 346 citations

Bilddifferenzverfahren in der Elektronenmikroskopie

1969 • 28 citations

Cited By (0)

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On the suitability of the available cooling holders for low-dose work with the Philips… (1984) – Ultramicroscopy | Metascience Observatory Explorer