Hydrogen implantation in silicon between 1.5 and 60 kev

Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de Graaff

1971 • 442 citations

Applications of Ion Beams to Metals

1974 • 433 citations

Stopping power of energetic helium ions transmitted through thin silicon crystals in channelling and random directions

1972 • 149 citations

Nondestructive Analysis for Trace Amounts of Hydrogen

1972 • 146 citations

A technique for measuring hydrogen concentration versus depth in solid samples

1973 • 133 citations

Identification of the dominant diffusing species in silicide formation

1974 • 125 citations

Sputtering and backscattering of keV light ions bombarding random targets

1973 • 123 citations

Depth profiling of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mmultiscripts><mml:mrow><mml:mi mathvariant="normal">He</mml:mi></mml:mrow><mml:mprescripts /><mml:mrow /><mml:mrow><mml:mn>3</mml:mn></mml:mrow><mml:mrow /><mml:mrow /></mml:mmultiscripts></mml:mrow></mml:math>and<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mmultiscripts><mml:mrow><mml:mi mathvariant="normal">H</mml:mi></mml:mrow><mml:…

1974 • 79 citations

Electrical properties of n-type Si layers doped with proton bombardment induced shallow donors

1972 • 76 citations

A gas-release study of the annealing of bombardment-induced disorder∗ (studies on bombardment-induced disorder—I)

1969 • 67 citations

A NEW utilization of¹¹B ion beams: Hydrogen analysis by¹H¹¹B,α)α α nuclear reaction

1974 • 65 citations

EPR of conduction electrons produced in silicon by hydrogen ion implantation

1974 • 58 citations

Location of interstitial deuterium sites in niobium by channeling

1972 • 49 citations

Spatial distribution of defects in ion bombarded silicon and germanium

1971 • 44 citations

Redistribution of boron in silicon after high−temperature proton irradiation

1975 • 39 citations

On conversion from an energy scale to a depth scale in channelling experiments

1973 • 37 citations

Ion bombardment induced phase transformations and inert gas mobility in the semiconductors Ge, Si, and GaAs

1970 • 37 citations

Transmission energy loss of light channeled particles in thin silicon crystals

1972 • 35 citations

Random stopping power for protons in silicon

1972 • 23 citations

Spectres de diffusion Raman du monocristal de thiourée dans les phases para-et ferroélectrique constantes de forces intermoléculaires

1973 • 19 citations

Non-destructive measurement of hydrogen in thin sheet materials

1974 • 15 citations

Mesure des variations du nombre moyen ν de neutrons prompts émis lors de la fission de 239Pu induite par des neutrons de résonances

1973 • 9 citations

Energy loss and projected range of alpha particles in zinc telluride

1974 • 8 citations

Damage in the Surface Region of Silicon Produced by Sputter-Etching

1974 • 7 citations

Blistering of Niobium Due to Low Energy Helium Ion Bombardment Investigated by Rutherford Backscattering

1974 • 5 citations

Depth Distribution and Migration of Implanted Helium in Metal Foils Using Proton Backscattering

1974 • 3 citations