Back to search
Ion scattering: a spectroscopic tool for study of the outermost atomic layer of a solid surface
Data up to Jan 2025
Published1972
Citations77
References6
Total Citations Per Year
Abstract
References (6)
High-Resolution Study of Electron-Impact Spectra at Kinetic Energies between 33 and 100 eV and Scattering Angles to 16°
1968 • 466 citations
Electron Monochromator Design
1967 • 377 citations
Analysis of surface composition with low-energy backscattered ions
1971 • 336 citations
Low-Energy Electron Diffraction Study of Silicon Surface Structures
1962 • 278 citations
Chlorine reactions on the Si (111) surface
1969 • 82 citations
Surface Composition Analysis by Binary Scattering of Noble Gas Ions
1970 • 55 citations
Cited By (0)
Loading...