Observation of Interface Band Structure by Ballistic-Electron-Emission Microscopy

Surface Studies by Scanning Tunneling Microscopy

1982 • 4,521 citations

Generalized Formula for the Electric Tunnel Effect between Similar Electrodes Separated by a Thin Insulating Film

1963 • 3,814 citations

Semiconducting and other major properties of gallium arsenide

1982 • 2,395 citations

The Analysis of Photoelectric Sensitivity Curves for Clean Metals at Various Temperatures

1931 • 1,398 citations

The structure and properties of metal-semiconductor interfaces

1982 • 908 citations

Semiconductors and Semimetals

1971 • 703 citations

Principles of electron tunneling spectroscopy

1986 • 667 citations

Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy

1988 • 545 citations

Direct Observation of Ballistic Transport in GaAs

1985 • 432 citations

Attenuation Length Measurements of Hot Electrons in Metal Films

1962 • 243 citations

Hot-Electron Spectroscopy of GaAs

1985 • 142 citations

Hot-Electron Transport in Semiconductor-Metal-Semiconductor Structures

1966 • 78 citations

Electron-phonon collector backscattering in hot electron transistors

1965 • 28 citations

Reliable and versatile scanning tunneling microscope

1988 • 15 citations

Elastic quantum resistance between metallic interfaces

1988 • 7 citations