Atomic force microscopy of liquid-covered surfaces: Atomic resolution images

Atomic Force Microscope

1986 • 14,074 citations

Review of Progress in Quantitative Nondestructive Evaluation

1996 • 1,968 citations

Scanning Tunneling Microscopy

1993 • 1,762 citations

Scanning tunneling microscopy

1987 • 644 citations

Single-tube three-dimensional scanner for scanning tunneling microscopy

1986 • 577 citations

Atomic Resolution with Atomic Force Microscope

1987 • 541 citations

The Topografiner: An Instrument for Measuring Surface Microtopography

1972 • 325 citations

Voltage-dependent scanning-tunneling microscopy of a crystal surface: Graphite

1985 • 294 citations

Interaction between a He atom and a graphite surface

1980 • 289 citations

Experimental Observation of Forces Acting during Scanning Tunneling Microscopy

1986 • 284 citations

Review of progress in quantitative non-destructive evaluation

1985 • 123 citations

Surface roughness measurements of low-scatter mirrors and roughness standards

1984 • 110 citations

Three-dimensional stylus profilometry

1982 • 87 citations

Semiconductor topography in aqueous environments: Tunneling microscopy of chemomechanically polished (001) GaAs

1987 • 63 citations

AIP 50th anniversary: Physics vade mecum

1981 • 21 citations