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Measuring Electrochemically Induced Surface Stress with an Atomic Force Microscope

Roberto Raiteri, Hans‐Jürgen Butt
DOI: 10.1021/j100043a008
The Journal of Physical Chemistry

Data up to Jan 2025

Published1995
Citations134
References0
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Computer scienceMaterials scienceInformation retrievalNanotechnologyWorld Wide Web

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