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Comment on ‘‘A theory on the x-ray sensitivity of a silicon surface-barrier detector including a thermal charge-diffusion effect’’ [J. Appl. Phys. 72, 3363 (1992)]
Data up to Jan 2025
Published1993
Citations18
References5
Total Citations Per Year
Abstract
References (5)
Methods of Theoretical Physics
1954 • 13,575 citations
Physics and technology of semiconductor devices
1967 • 2,850 citations
Depletion-Layer Photoeffects in Semiconductors
1959 • 965 citations
SEM Microcharacterization of Semiconductors
1986 • 100 citations
A theory on the x-ray sensitivity of a silicon surface-barrier detector including a thermal charge-diffusion effect
1992 • 14 citations
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