Work function and structural studies of alkali-covered semiconductors
Data up to Jan 2025
Total Citations Per Year
Abstract
References (24)
The Nature of the Chemical Bond
1939 • 13,296 citations
Crystalline Zeolites. I. The Properties of a New Synthetic Zeolite, Type A
1956 • 601 citations
The Concept Of Electronegativity
1955 • 599 citations
Work Function, Photoelectric Threshold, and Surface States of Atomically Clean Silicon
1962 • 458 citations
Analysis of Materials by Electron-Excited Auger Electrons
1968 • 450 citations
Surface Structures and Properties of Diamond-Structure Semiconductors
1961 • 409 citations
Use of LEED Apparatus for the Detection and Identification of Surface Contaminants
1967 • 256 citations
Structures of Clean Surfaces of Germanium and Silicon. I
1963 • 242 citations
The tunnel effect correction for parabolic potential barriers
1959 • 238 citations
Application of the Ion Bombardment Cleaning Method to Titanium, Germanium, Silicon, and Nickel as Determined by Low-Energy Electron Diffraction
1958 • 220 citations
Observations of “Clean” Surfaces of Si, Ge, and GaAs by Low-Energy Electron Diffraction
1965 • 213 citations
Low energy electron diffraction studies on Ge and Na-covered Ge
1967 • 143 citations
The Analysis and Purification of Rare Gases by Means of Electric Discharges
1954 • 121 citations
Work-Function Studies of Germanium Crystals Cleaned by Ion Bombardment
1957 • 116 citations
Comparison of the Photoelectric Properties of Cleaved, Heated, and Sputtered Silicon Surfaces
1964 • 110 citations
Energy Structure in Photoelectric Emission from Cs-Covered Silicon and Germanium
1966 • 104 citations
Secondary Emission Studies on Ge and Na-Covered Ge
1967 • 97 citations
Aluminosilicate Alkali Ion Sources
1966 • 94 citations
Electronic Ultra-High Vacuum Pump
1958 • 89 citations
Work Function and Sorption Properties of Silicon Crystals
1958 • 88 citations
Work function and emission studies on clean silicon surfaces
1959 • 78 citations
A Simple Contamination-Free Electron Gun
1950 • 21 citations
Determination of Crystal Orientation by High Intensity Reflectograms
1959 • 15 citations
Simple Technique for Examination of Sputtering Patterns
1964 • 7 citations