Oxide-Charge-Induced Impurity Level in Silicon Inversion Layers

Properties of Semiconductor Surface Inversion Layers in the Electric Quantum Limit

1967 • 1,889 citations

Transport Properties of Electrons in Inverted Silicon Surfaces

1968 • 327 citations

Mott-Anderson Localization in the Two-Dimensional Band Tail of Si Inversion Layers

1974 • 99 citations

Variable-range hopping in a silicon inversion layer

1974 • 72 citations

Peaked structure appearing in the field effect mobility of silicon MOS devices at temperatures above 20K

1974 • 15 citations

Two-Dimensional Impurity States in an n-Type Inversion Layer of Silicon

1972 • 14 citations