MOS Compatibility of high-conductivity TaSi₂/n⁺poly-Si gates

Fowler-Nordheim Tunneling into Thermally Grown SiO2

1969 • 1,642 citations

A simple theory to predict the threshold voltage of short-channel IGFET's

1974 • 395 citations

Method of Determining Reliability Screens for Time Dependent Dielectric Breakdown

1979 • 167 citations

Electron trapping in electron-beam irradiated SiO2

1978 • 148 citations

MOS Avalanche and Tunneling Effects in Silicon Surfaces

1967 • 68 citations

A Single-Chip VLSI Echo Canceler

1980 • 48 citations

Avalanche‐Induced Hot Electron Injection and Trapping in Gate Oxides on p‐Si

1980 • 7 citations