Sputtering of annealed aluminum and of sintered aluminum powder (SAP 895) under D+ and 4He+ bombardment: Study of microstructural effects

Handbook of Thin Film Technology

1971 • 2,898 citations

Handbook of Auger electron spectroscopy

1982 • 2,143 citations

Scientific foundations of vacuum technique

1962 • 1,662 citations

Hydrogen Stopping Powers and Ranges in All Elements

1977 • 1,335 citations

Scientific Foundations of Vacuum Technique

1962 • 852 citations

X-ray photoelectron spectroscopic studies of nickel-oxygen surfaces using oxygen and argon ion-bombardment

1974 • 793 citations

The application of electron spectroscopy to surface studies

1974 • 395 citations

General formalism for quantitative Auger analysis

1975 • 200 citations

Dielectric Thin Films through rf Sputtering

1966 • 166 citations

Measurements of the erosion of stainless steel, carbon, and SiC by hydrogen bombardment in the energy range of 0.5 – 7.5 keV

1976 • 84 citations

Physical sputtering model for fusion reactor first-wall materials

1978 • 77 citations

The influence of surface structures on sputtering: Angular distribution and yield from faceted surfaces

1978 • 69 citations

Data on Low Energy Light Ion Sputtering

1979 • 63 citations

Surface Analysis Techniques for Metallurgical Applications

1976 • 42 citations

The significance of a correlation of blister diameter with skin thickness for Ni and Be for blistering models

1978 • 39 citations

Reduction of surface erosion caused by helium blistering: Microstructural effects

1975 • 28 citations

Radiation effects on solid surfaces

1977 • 25 citations

Sputtering Measurements on Controlled Thermonuclear Reactor Materials Using Auger Electron Spectroscopy

1976 • 23 citations

Reduction of surface erosion caused by helium blistering in sintered beryllium and sintered aluminum powder

1976 • 19 citations

Formation of various coatings and their behaviour under particle bombardment

1979 • 19 citations

Surface damage of TiB2 and C coatings under energetic D+ AND 4He+ irradiations

1979 • 18 citations

Abstract: AES characterization of oxidized films of Mg, Al, and Si

1976 • 8 citations