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Automatic display of C-V curves for metal-insulator-semiconductor (MIS) structures
Data up to Jan 2025
Published1966
Citations3
References3
Total Citations Per Year
Abstract
References (3)
An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes
1962 • 1,405 citations
Limitations of the MOS capacitance method for the determination of semiconductor surface properties
1965 • 130 citations
Field Effect‐Capacitance Analysis of Surface States on Silicon
1963 • 115 citations
Cited By (0)
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