SEM and TEM studies of defects in Si‐doped GaAs substrate material before and after Zn diffusion

Determination of Optical Constants and Carrier Effective Mass of Semiconductors

1957 • 724 citations

Etching of Dislocations on the Low-Index Faces of GaAs

1965 • 337 citations

Rapid zinc diffusion in gallium arsenide

1962 • 222 citations

Semiconductor material assessment by scanning electron microscopy*

1977 • 65 citations

The identification of saucer-pit (S-pit) defects in GaAs

1978 • 24 citations

The junction depth of concentration-dependent diffusion. Zinc in III–V compounds

1964 • 23 citations

Anisotropic etching behaviour of gallium arsenide junctions

1974 • 6 citations