Carbon<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>K</mml:mi></mml:math>-edge fine structure in graphite foils and in thin-film contaminants on metal surfaces
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References (25)
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Carbon<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>K</mml:mi></mml:math>Edge in Graphite Measured Using Electron-Energy-Loss Spectroscopy
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1978 • 96 citations
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1978 • 95 citations
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1979 • 46 citations
X-ray absorption fine structure above the Ti<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>L</mml:mi></mml:math>edge
1979 • 41 citations
Determination of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>s</mml:mi></mml:math>and<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>d</mml:mi></mml:math>contributions to the<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi>L</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn><mml:mo>,</mml:mo><mml:mn>3</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>extended x-…
1977 • 36 citations
Electron microscope studies op graphitization and deformation in carbon film
1962 • 16 citations
Rotating Beam Splitter for the Extreme Vacuum Ultraviolet
1974 • 11 citations
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