Method for Detecting Fine Structure in the Secondary Electron Emission Yield and the Application to Si(111)

Auger electron spectroscopy

1971 • 543 citations

Analysis of Materials by Electron-Excited Auger Electrons

1968 • 450 citations

Low Voltage Electron Diffraction Study of the Oxidation and Reduction of Silicon

1962 • 276 citations

Surface studies by electron diffraction

1971 • 238 citations

The LEED Instrument Response Function

1971 • 126 citations

Electron-beam assisted adsorption on the Si(111) surface

1970 • 112 citations

Secondary Emission Studies on Ge and Na-Covered Ge

1967 • 97 citations

Auger Electron Emission in the Energy Spectra of Secondary Electrons from Mo and W

1956 • 92 citations

IONIZATION SPECTROSCOPY OF SURFACES

1970 • 77 citations

Auger spectroscopy of titanium

1971 • 73 citations

LEED Beam Broadening as a Result of Sputtering Damage

1966 • 52 citations

Magnetic Field Uniformity around Near-Helmholtz Coil Configurations

1969 • 46 citations

Pulsed-Beam Low Energy Electron Diffraction System for Rapid Precision Measurements

1964 • 45 citations

CHARACTERISTIC IONIZATION LOSSES OBSERVED IN AUGER EMISSION SPECTROSCOPY

1970 • 36 citations

Ionization Spectrometer for Elemental Analysis of Surfaces

1971 • 33 citations

LEED investigations of clean and Au-stabilised Si surfaces

1970 • 30 citations

Electron impact study of insulator surfaces: LiF and NaF

1971 • 20 citations

Orbitron Pump of 30-cm Diameter

1964 • 19 citations

Studies of silicon and its oxygen adsorption by low energy electron scattering

1970 • 13 citations

CHARACTERIZATION OF SILICON SURFACES BY THE ELECTRON ENERGY-LOSS SPECTRUM

1970 • 6 citations

Secondary Electron Emission from Eiffusion Pump

1970 • 1 citations