Cryogenic, whole wafer imaging of semi-insulating GaAs

Optical assessment of the main electron trap in bulk semi-insulating GaAs

1981 • 479 citations

Correlations of photoluminescence with defect densities in semi-insulating gallium arsenide

1985 • 73 citations

The role of deep-level centers and compensation in producing semi-insulating GaAs

1983 • 53 citations

Optical properties of EL2

1988 • 40 citations

Optical Mapping of the Total EL2-Concentration in Semi-Insulating GaAs-Wafers

1989 • 34 citations

High-resolution imaging of the EL2 distribution in thin semi-insulating GaAs wafers: A comparison with x-ray topography

1986 • 25 citations

Proximity effect of dislocations on GaAs MESFET threshold voltage

1986 • 24 citations

Substrate-impurities effects on GaAs MESFETs

1988 • 24 citations

Microscopic spatial fluctuations of the EL2 defect in semi-insulating GaAs: Influence on bulk resistivity and correlation with implant activation

1988 • 15 citations

Optical techniques for characterizing SI GaAs

1989 • 13 citations

Factors affecting the spatial distribution of the principal midgap donor in semi-insulating gallium arsenide wafers

1985 • 12 citations

Quantitative, all-optical prediction of the carrier density in semi-insulating GaAs

1990 • 8 citations

A low-temperature, whole-wafer-imaging system for defect and impurity mapping

1991 • 5 citations

Near Band-Edge and Deep-Level Related Luminescence Images near Dislocations in In-Alloyed Czochralski GaAs

1987 • 4 citations