Direct comparison of ion scattering and secondary ion emission as tools for analysis of metal surfaces

Theorie der Streuung schneller geladener Teilchen I. Einzelstreuung am abgeschirmten Coulomb-Feld

1947 • 1,649 citations

Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

1973 • 440 citations

Auger Ejection of Electrons from Tungsten by Noble Gas Ions

1954 • 368 citations

Analysis of surface composition with low-energy backscattered ions

1971 • 336 citations

Sputtering of Surfaces by Positive Ion Beams of Low Energy

1958 • 258 citations

Analysis of the outermost atomic layer of a surface by low-energy ion scattering

1973 • 139 citations

Investigation of Surface Topography of Oxygen on Nickel Single Crystals by Helium Ion Backscattering

1972 • 112 citations

Reflection of Noble Gas Ions at Solid Surfaces

1961 • 96 citations

Sputtering Ion Source for Solids

1963 • 95 citations

Investigation of surface reactions by the static method of secondary ion mass spectrometry

1974 • 93 citations

New developments in the surface analysis of solids

1973 • 77 citations

The energy spectra of sputtered ions

1972 • 64 citations

A low background secondary ion mass spectrometer with quadrupole analyser

1973 • 63 citations

Untersuchungen zur Emission positiver Sekundärionen aus festen Targets. Die Brauchbarkeit der Ionenbeschuß-Ionenquelle in der Massenspektroskopie

1967 • 63 citations

Surface Composition Analysis by Binary Scattering of Noble Gas Ions

1970 • 55 citations

Investigation of Solids by Means of an Ion-Bombardment Mass Spectrometer

1969 • 44 citations

Ions Sputtered from Copper

1962 • 30 citations

Untersuchung über die Emission positiver Sekundärionen und die Reflexion von Edelgasionen an Festkörperoberflächen

1963 • 24 citations

Direct Comparison of Auger Electron Spectroscopy with Appearance Potential Spectroscopy

1972 • 17 citations

Massenspektrometrische Untersuchung der Sekundärionen-Emission von Legierungen

1968 • 14 citations

Analysis of stainless steel surfaces by secondary ion mass spectroscopy (SIMS)

1972 • 14 citations

Auger Electron Spectroscopy Studies of Sputter Deposition and Sputter Removal of Mo from Various Metal Surfaces

1972 • 1 citations