Voltage measurement in the scanning electron microscope

Analysis of Materials by Electron-Excited Auger Electrons

1968 • 450 citations

Cylindrical Capacitor as an Analyzer I. Nonrelativistic Part

1967 • 215 citations

Angular Aberrations in Sector Shaped Electromagnetic Lenses for Focusing Beams of Charged Particles

1953 • 175 citations

Microanalysis by Means of Electrons

1944 • 160 citations

Comparison of the Spherical Deflector and the Cylindrical Mirror Analyzers

1968 • 131 citations

Scanning Electron Microscopes: Is High Resolution Possible?

1966 • 107 citations

Electron Gun using Long-Life Lanthanum Hexaboride Cathode

1967 • 97 citations

Evaluation of Passivated Integrated Circuits Using the Scanning Electron Microscope

1964 • 89 citations

Kelvin Device to Scan Large Areas for Variations in Contact Potential

1962 • 71 citations

Electron beam induced potential contrast on unbiased planar transistors

1967 • 61 citations

Zur Energieverteilung der Sekundärelektronen II. Meßergebnisse und Diskussion

1947 • 59 citations

Electron beam scanning technique for measuring surface work function variations

1966 • 48 citations

Heating effect of an electron beam impinging on a solid surface, allowing for penetration

1964 • 25 citations

Steuerwirkung eines geladenen Teilchens im Feld einer Sekund�remissionskathode

1941 • 13 citations