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New scanning tunneling microscopy tip for measuring surface topography

Yoshiaki Akama, E. Nishimura, Akira Sakai, Hiroshi Murakami
DOI: 10.1116/1.576413
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Data up to Jan 2025

Published1990
Citations152
References0
Fields
Materials sciencePhysicsGeologyOpticsNanotechnologyOptoelectronics

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New scanning tunneling microscopy tip for measuring surface topography (1990) – Journal of Vacuum Science & Technology A Vacuum Surfaces and Films | Metascience Observatory Explorer