A new force controlled atomic force microscope for use in ultrahigh vacuum

Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity

1991 • 2,312 citations

A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy

1993 • 1,619 citations

Novel optical approach to atomic force microscopy

1988 • 1,241 citations

Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

1995 • 1,153 citations

Method for the calibration of atomic force microscope cantilevers

1995 • 942 citations

Scanning Probe Microscopy and Spectroscopy

1994 • 697 citations

Improved fiber-optic interferometer for atomic force microscopy

1989 • 612 citations

Interatomic Forces in Scanning Tunneling Microscopy: Giant Corrugations of the Graphite Surface

1986 • 444 citations

Mechanical deflection of cantilever microbeams: A new technique for testing the mechanical properties of thin films

1988 • 379 citations

Tip Surface Interactions in STM and AFM

1987 • 373 citations

An utrasonic study of the area of contact between stationary and sliding surfaces

1971 • 354 citations

Observation of 7×7 Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy

1995 • 336 citations

Force microscope using a fiber-optic displacement sensor

1988 • 262 citations

Manipulating atoms and molecules with a scanning tunneling microscope

1992 • 197 citations

Forces in Scanning Probe Methods

1995 • 192 citations

Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope

1995 • 147 citations

A novel force microscope and point contact probe

1993 • 135 citations

First Principles Simulations of Silicon Nanoindentation

1995 • 52 citations

Mechanics of Contacts at Less than 100Å Scale: Indentation and AFM

1993 • 6 citations