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Ion implantation and SIMS profiling of impurities in II-VI materials (HgCdTe and CdTe)

Data up to Jan 2025

Published1988
Citations11
References8

Total Citations Per Year

Abstract

Ion implantation and SIMS profiling of impurities in II-VI materials (HgCdTe and CdTe) (1988) – Journal of Crystal Growth | Metascience Observatory Explorer