Charge centroid and trapping model for MNOS structures

K. Lehovec, D. W. Crain

DOI: 10.1063/1.322940

Journal of Applied Physics

Data up to Jan 2025

Published1976

Citations32

References3

Fields

Chemistry Materials science Physics Computer science Biology Atomic physics Nuclear physics Ecology

Total Citations Per Year

Abstract

References (3)

Silicon nitride trap properties as revealed by charge−centroid measurements on MNOS devices

1975 • 155 citations

Measurements of charge propagation in Si3N4 films

1974 • 84 citations

Electron and hole transport in CVD Si3N4 films

1975 • 58 citations

Cited By (0)

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