Study of silicon-oxygen interaction with the statical method of secondary ion mass spectroscopy (SIMS)

Structure and Adsorption Characteristics of Clean Surfaces of Germanium and Silicon

1959 • 873 citations

Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

1973 • 440 citations

Die Analyse monomolekularer FestkörperoberflÄchenschichten mit Hilfe der SekundÄrionenemission

1970 • 264 citations

Beobachtung von oberflächenreaktionen mit der statischen methode der sekundärionen-massenspektroskopie. I die methode

1971 • 150 citations

Measurement of oxygen adsorption on silicon by ellipsometry

1965 • 115 citations

An investigation of silicon-oxygen interactions using Auger electron spectroscopy

1971 • 100 citations

Investigation of the surface oxidation of metals in the sub-monolayer and monolayer range with the static method of secondary ion mass spectrometry

1972 • 30 citations

Combined Auger electron spectroscopy and electron impact desorption studies of silicon surfaces

1972 • 11 citations