Probing Nanoscale Dipole-Dipole Interactions by Electric Force Microscopy

Atomic force microscope–force mapping and profiling on a sub 100-Å scale

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Selective assembly on a surface of supramolecular aggregates with controlled size and shape

2001 • 837 citations

Two-Dimensional Self-Assembly of Supramolecular Clusters and Chains

1999 • 397 citations

Charge, Polarizability, and Photoionization of Single Semiconductor Nanocrystals

1999 • 300 citations

Origin and Scaling of the Permanent Dipole Moment in CdSe Nanorods

2003 • 202 citations

Electric force microscopy of individually charged nanoparticles on conductors: An analytical model for quantitative charge imaging

2004 • 91 citations

Charge injection in individual silicon nanoparticles deposited on a conductive substrate

2002 • 58 citations

Charging of single Si nanocrystals by atomic force microscopy

2001 • 54 citations

Models of image contrast in scanning force microscopy on insulators

1999 • 28 citations

Short-range electrostatic interactions in atomic-resolution scanning force microscopy on the<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi mathvariant="normal">Si</mml:mi><mml:mn /><mml:mo>(</mml:mo><mml:mn>111</mml:mn><mml:mo>)</mml:mo><mml:mn>7</mml:mn><mml:mo>×</mml:mo><mml:mn>7</mml:mn></mml:math>surface

2003 • 27 citations